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 Category: SOCcentral Feature Articles & Columns: Feature Articles: Saturday, October 22, 2016
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Blindsided by a Glitch 

November 19, 2012 -- The blindside blitz. The quarterback's greatest fear. The big hit that arrives with no warning and the cover bypassed. In SOC design, particularly in clock-domain-crossing (CDC) analysis, RTL designers can also believe they ... read more

Profiling Defect Sites for Yield Improvement 

November 9, 2012 -- While the industry progressively heads towards IC designs at 20nm and below, the challenges of profitably manufacturing these designs continue to emerge. As foundries confront the issues of manufacturing an acceptable yield, ... read more

New IJTAG Standard Simplifies SOC Verification and Test Processes 

November 5, 2012 -- Modern SOCs are a complex mix of embedded-IP cores, customized logic provided by the chip supplier and a myriad of communication interfaces. SOC designers have found that accessing instruments embedded into their chips and em ... read more

Solutions for Mixed-Signal SOC Implementation 

October 25, 2012 -- Since virtually all systems-on-chip (SOCs) contain some analog circuitry, many SOC design engineers have some familiarity with mixed-signal implementation. Nevertheless, a new set of challenges is emerging as the amount of an ... read more

Vendor-Independent RTL Memory BIST Insertion and Verification 

October 23, 2012 -- ASIC vendors have traditionally incorporated built-in self-test (BIST) and repair solutions in their customers' gate-level netlists. This used to be the common industry practice for technology nodes of 65nm and older. Designe ... read more

The IP Blame Game 

October 10, 2012 -- The topic of IP quality in the SOC era is difficult to define, and solutions to problems relating to IP quality, verification, and use are hard to find. Debates rage between IP users, suppliers, and EDA vendors about where th ... read more

Already Scanned Today? 

September 21, 2012 -- Since its standardization as IEEE 1149.1 in 1990, JTAG/ Boundary Scan has developed to one of the most important technology within the ensemble of various test strategies. This technology's high dynamics and practical relev ... read more

Use the Power of Your SOC to Verify Its Low-Power Design Features 

September 1, 2012 -- The worlds of system-on-chip (SOC) development and low-power design are almost completely intertwined these days. Most SOCs are developed for portable consumer devices where battery life can make or break a product. If the S ... read more

Challenges and Requirements for Power-Aware Debugging 

August 27, 2012 -- Traditionally, area and timing have been the major issues faced by IC designers. Now, power has also emerged as a major concern for three reasons. First, low power is favored by numerous end-applications, such as cellular phon ... read more

SCE-MI Explained: Macro-based and Function-based 

August 24, 2012 -- SCE-MI stands for Standard Co-Emulation Modeling Interface and is the Accellera standard for bridging two realms: un-timed (HLV, on a host) and timed (HDL, in an emulator). The main goal was to eliminate communication bottlene ... read more

Solutions for Mixed-Signal SOC Verification 

August 21, 2012 -- Driven by growth opportunities in mobile communication, networking, power management, automotive, medical, imaging, and security applications, many silicon vendors are refocusing their business on RF, high-performance analog a ... read more

Leapfrogging the Competition Through Smart IP Selection 

August 17, 2012 -- The adoption of a reliable design reuse methodology, proliferation of high-quality IP products, and shake-out of the most un-trustworthy IP vendors creates a situation offering a huge potential advantage to system integrators ... read more

Hybrid Prototyping Delivers the Best of Both Virtual and FPGA Prototyping to SOC Hardware and Software Teams 

August 3, 2012 -- The complexity and cost of software development is impacting the timely introduction of new electronic system products, often undermining a product's market acceptance due to bugs that hide until after production. Recent indust ... read more

8051s in the Spectrum of Microcontroller Choices 

July 20, 2012 -- There is a broader range of processor choices available to embedded systems and product designers today than ever before. At the higher end, some of the most exciting products use full 32-bit processors, such as the dual-ARM Cor ... read more

3D-IC System Verification Methodology: Solutions and Challenges 

July 20, 2012 -- The performance and cost savings for moving toward through-silicon via (TSV)-based three-dimensional (3D) integration motivations have been identified [1]-[2]. 3D integrated circuit (IC) technology enables shorter critical inter ... read more

Testing the 3D Waters 

July 19, 2012 -- There certainly has been no lack of talk these days on the industry's eventual migration to 3D-ICs. No matter which conference you go to or which trade publication you read, you are bound to encounter some 3D-related material. A ... read more

The Evolution of Power Format Standards 

July 16, 2012 -- The Silicon Integration Initiative's (Si2's) contribution of the Open Low-Power Methodology (OpenLPM) to the IEEE in 2011 marked an important milestone in the development of power-format standards for the industry. Cadence, amon ... read more

Understanding the Low Power Abstraction 

July 6, 2012 -- Electronic systems are inherently complex, and increasingly so with greater integration. What has allowed us to design and verify such systems at all has been the adoption of abstract models that deliberately exclude certain deta ... read more

Power Is on Everybody's Mind 

June 29, 2012 -- At the recent Design Automation Conference (DAC) in San Francisco, visitors to the EVE booth learned how system-on-chip (SOC) emulators have evolved to support the needs of modern SOC realization. Recent advances in the hardware ... read more

Test Automation of 3D Integrated Systems 

Advances in packaging technologies have led to the development of three-dimensional (3D) integrated systems that offer the potential to deliver significant improvements in performance, power, functional density, and form factor over systems that rely o ... read more

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