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 Category: Magazine & Journal Articles Online: Article Archive 2003: Wednesday, April 23, 2014
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Simple Techniques for Making Verification Reusable  by Integre Technologies LLC in eeDesign (EE Times EDA News)

March 21, 2003 -- Writing reusable verification code takes extra effort and requires engineers to follow some basic guidelines. In many respects, this is no different than writing reusable software modules or maintainable RTL hardware modules. E ... read more

Merged-Logic-Type Embedded DRAM Suits High-Performance SoCs  by NEC Electronics America, Inc. in Electronic Engineering Times (EE Times)

March 19, 2003 -- To push access times toward those of SRAM while achieving much higher densities, embedded DRAM needs a structure that differs from both commodity DRAM and conventional embedded DRAM. The challenge is to develop a semiconductor ... read more

Manufacturability, Scalability: a Critical Test of SoC Memories Strategies  by  in Electronic Engineering Times (EE Times)

March 18, 2003 -- Since no one questions the performance benefits of embedding large memory blocks in SoCs, the only major issues to address are cost, time to market and design risk. Memory structures that are highly manufacturable and scalable ... read more

Mobile Generation Needs FRAM  by Texas Instruments, Inc. (TI) in Electronic Engineering Times (EE Times)

March 18, 2003 -- In the late 1990s, after more than a decade of ferroelectric-memory development, several companies succeeded in the high-volume production of low-density (less than 1-Mbit) ferroelectric RAM. These nonvolatile memories have an ... read more

Nonvolatile Memories for 90-nm SoC and Beyond  by  in Electronic Engineering Times (EE Times)

March 18, 2003 -- In many SoC applications, it is desirable to store code and data in a non-volatile memory to maintain the state of the system even in the power-off state. The most flexible solution is to embed a Flash EEPROM into the SoC, in w ... read more

Speed with Flexible Design Critical to Embedded DRAM for SoCs  by IBM Corp. in Electronic Engineering Times (EE Times)

March 18, 2003 -- The incorporation of embedded dynamic random-access memory (DRAM) in a system-on-chip (SoC) environment presents some unique challenges. IBM has developed an embedded DRAM solution for application-specific integrated circuit (A ... read more

Philips' Silicon Hive to develop IP cores  by  in Electronic Engineering Times (EE Times)

March 14, 2003 Eindhoven, Netherlands -- "Philips Research is spinning out a reconfigurable computing architecture it has kept under wraps since the early 1990s to an incubator company called Silicon Hive, which will develop and license synthesi ... read more

Shifting from Functional to Structured Techniques Improves Test Quality  by Synopsys, Inc. in Electronic Engineering Times (EE Times)

March 10, 2003 -- "It is becoming clear that functional testing of integrated circuits, the most widely used and oldest method in the semiconductor industry has reached the limits of its effectiveness. Functional Test methods rely on a of pre-ex ... read more

What Designers Need to Know about Structural Test  by LTX-Credence Corp. in eeDesign (EE Times EDA News)

March 6, 2003 -- "Facing both increasing competitive pressures and rising device complexity, integrated circuit (IC) companies are looking for more effective strategies able to speed delivery to market of higher quality products. Until now, manu ... read more

Linking Synthesis with DFT Key for Network Switch ICs  by Get2Chip, Inc. in Electronic Engineering Times (EE Times)

March 4, 2003 -- "As the challenges of network execution time reach new heights, the question of integrating synthesis and design-for-test (DFT) in the fabrication of high density networking devices merits reassessment.

"The challenges th ... read more




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