July 14, 2011 -- With automotive display cluster being the main means to convey the status and information of a vehicle system and drive conditions, it is of utmost importance to ensure reliable functional testing for these cluster devices. This article describes the test coverage for a typical automotive cluster and how these tasks are done through system simulation techniques.
By Cynthia Chuah, Choong-Hooi Lee, and You-Yan Chong. (Chuah is a technical marketing engineer, while Choong-Hooi Lee and You-Yan Chong are R&D manager and engineer respectively for Agilent Technologies, Inc.'s automotive and board functional test product line.)
This brief introduction has been excerpted from the original copyrighted article.