Testing, instrumentation, and measurement electronics require high reliability and high quality complex integrated circuits (ICs) to ensure the accuracy of the analytical data they process. Microprocessors and other complex ICs such as FPGAs are considered the most important components within instrumentation. They are susceptible to electrical, mechanical and thermal modes of failure like other components on a printed circuit board, and due to their complexity and roles within a circuit, performance-based failure can be considered an even larger concern. Stability of device parameters is key to guaranteeing that a system will function according to its design. We discuss the importance of microprocessor and IC device reliability and how modifying the operational parameters of these devices through over- and under-clocking can either reduce or improve overall reliability, respectively, and directly affect the lifetime of the system in which these devices are installed.